Over 10 mio. titler Fri fragt ved køb over 499,- Hurtig levering Forlænget returret til 31/01/25
Studiebog DRM-beskyttet
Scanning Force Microscopy

Scanning Force Microscopy

- With Applications to Electric, Magnetic, and Atomic Forces

  • Format
  • E-bog, PDF
  • Engelsk
E-bogen er DRM-beskyttet og kræver et særligt læseprogram

Beskrivelse

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Læs hele beskrivelsen
Detaljer

Findes i disse kategorier...

Se andre, der handler om...

Machine Name: SAXO084