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Progress in Nanoscale Characterization and Manipulation

- Progress in Nanoscale Characterization and Manipulation

Forfatter: info mangler
Bog
  • Format
  • Bog, paperback
  • Engelsk

Beskrivelse

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

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Detaljer
  • SprogEngelsk
  • Sidetal518
  • Udgivelsesdato11-01-2019
  • ISBN139789811344206
  • Forlag Springer Verlag, Singapore
  • Nummer i serien272
  • FormatPaperback
Størrelse og vægt
  • Vægt783 g
  • Dybde2,7 cm
  • coffee cup img
    10 cm
    book img
    15,5 cm
    23,5 cm

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