Over 10 mio. titler Fri fragt ved køb over 499,- Hurtig levering 30 dages retur
Bliv medlem
Log ind Opret dig

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices

Forfatter: info mangler
  • Format
  • E-bog, PDF
  • Engelsk
E-bogen er DRM-beskyttet og kræver et særligt læseprogram

Beskrivelse

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

Læs hele beskrivelsen
Detaljer

Findes i disse kategorier...

Se andre, der handler om...

Machine Name: SAXO082