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    Characterization of Semiconductor Materials, Volume 1

    Characterization of Semiconductor Materials, Volume 1

    - Volume 1

    Forfatter: info mangler
    Bog
    • Format
    • Bog, hardback
    • Engelsk

    Beskrivelse

    Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.

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    Detaljer
    • SprogEngelsk
    • Sidetal344
    • Udgivelsesdato10-06-2009
    • ISBN139780815512004
    • Forlag William Andrew Publishing
    • MålgruppeFrom age 0
    • FormatHardback
    Størrelse og vægt
  • Vægt760 g
  • Dybde2,1 cm
    • coffee cup img
    10 cm
    book img
    15,2 cm
    22,9 cm

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    Machine Name: SAXO081