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    Advances in Imaging and Electron Physics

    Advances in Imaging and Electron Physics

    - Volume 223

    Forfatter: info mangler
    Bog
    • Format
    • Bog, hardback
    • Engelsk

    Beskrivelse

    Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

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    Detaljer
    • SprogEngelsk
    • Sidetal266
    • Udgivelsesdato25-08-2022
    • ISBN139780323988636
    • Forlag Academic Press Inc
    • FormatHardback
    Størrelse og vægt
  • Vægt540 g
    • coffee cup img
    10 cm
    book img
    15,2 cm
    22,9 cm

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    Indexing Scanning electron microscopy Spin waves Gnd Nanostructure Accuracy EBSD High Angular Resolution Homography Ferrite magnetic materials Grain internal disorientation HR-EBSD IC-GN HR-TKD elastic strains Limiters Magnetodynamic equations of motion Limiting electromagnetic (EM) signals from antennas Orientation imaging microscopy Optical distortion Nonlinear Interaction TKD
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