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VLSI Test Principles and Architectures

- Design for Testability

Bog
  • Format
  • Bog, paperback
  • Engelsk
  • 808 sider

Beskrivelse

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

. Most up-to-date coverage of design for testability.

. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.

. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

. Lecture slides and exercise solutions for all chapters are now available.

. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."

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Detaljer
  • SprogEngelsk
  • Sidetal808
  • Udgivelsesdato21-07-2006
  • ISBN139781493300860
  • Forlag Morgan Kaufmann Publishers
  • Nummer i serien429
  • FormatPaperback
  • Udgave0
Størrelse og vægt
  • Vægt1292 g
  • Dybde2,7 cm
  • coffee cup img
    10 cm
    book img
    21,5 cm
    28,1 cm

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